Metrology

Laser light has unique properties for measuring distances, movements, areas etc as the wavelength and other properties of the laser are well controlled. To optimally benefit from this potential, we believe laser photonics should be more simple, robust, compact and cost effective. We enable this potential with our modules based on broadband (400-2300nm) Photonic Integrated Circuits.

LXI designs and manufactures customized modules for photonic OEMs and System integrators. The PIC modules are based on our photonic integration technology and can manipulate laser light by splitting beams, combining beams, controlling intensity, phase, mode size and input- output configurations.

Our PIC modules are used in different types of products in Metrology applications, like Laser Interferometry (homodyne, heterodyne and multiwavelength), OCT, and spectrometry

In many applications for optical metrology one or more lasers are used to measure distances, surfaces or motion. Typically also the position and spot size of the light at the substrate or target is subjected to tight specifications. These systems are currently built using discrete optical components. Our PICs are beneficial for these applications as they increase robustness, reliability and compactness and open the route to new methods of measuring.